P740 Probe Series

ATE push fit test probe with a compact design.

Short travel probe with various head styles available.

Mil	75
Centres	1.91 mm
Full Travel	3.00 mm
Working Travel	2.40 mm
Current Resistance	2.00 amps
Continuity Resistance	20.00 mOhms
Product Series	P740
Application	Fine Pitch ICT/FCT
Solutions	Fine Pitch Testing PCB & ATE Testing Short Travel Testing

Please choose your Head Diameter and/or Head style to select Probes. The suitable part numbers are then shown below our head style images.

Part Number	Head Diameter	Working Travel Spring Force	Spring Part	Head Style
P740-B	0.45 mm	0.80 N		Spear - B
P740-BT80	0.74 mm	0.80 N		Dagger - BT80
P740-BT80-1	0.74 mm	1.10 N	-1	Dagger - BT80
P740-C	1.50 mm	0.80 N		Serrated - C
P740-D	1.00 mm	0.80 N		Dome - D
P740-D1	0.50 mm	0.80 N		Headless Dome - D
P740-D2	0.65 mm	0.80 N		Dome - D
P740-D3	0.74 mm	0.80 N		Dome - D
P740-D3-1	0.74 mm	1.10 N	-1	Dome - D
P740-E2	1.22 mm	0.80 N		Cone - E
P740-E2-1	1.22 mm	1.10 N	-1	Cone - E
P740-F	1.50 mm	0.80 N		Flat - F
P740-F2	1.00 mm	0.80 N		Flat - F
P740-H	1.50 mm	0.80 N		Chisel - H
P740-L	0.74 mm	0.80 N		Headless 4 Point Crown - L
P740-L-1	0.74 mm	1.10 N	-1	Headless 4 Point Crown - L
P740-Q	1.50 mm	0.80 N		4 Point Crown - Q
P740-Q1	1.02 mm	0.80 N		4 Point Crown - Q
P740-Q1-1	1.02 mm	1.10 N	-1	4 Point Crown - Q
P740-Q2	1.22 mm	0.80 N		4 Point Crown - Q
P740-Q2-1	1.22 mm	1.10 N	-1	4 Point Crown - Q
P740-A2	1.40 mm	0.80 N		Concave - A

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