Each block is provided with 3 crown-headed test probes which together achieve a total working spring force of 18 Newtons.
View the brand new series here and buy yours online today.
The scratch contact is well suitable for reliable contacts that are under diffucult conditions. It contacts not only axially, but also causes a lateral scratch movement because of the incline the test probes are inserted at. This lateral scratching improved the quality of the electrical contact compared to standard high current test probes.
The advantage of this solution is a more effective penetration of passivation layers and contaminations and also provides a deeper penetration. This creates an increased contact surface and contact force, leading to a higher ampacity of the contact. The increased contact reliability of critical materials such as aluminium and nickel is remarkable.
The probe tips are contacting in a distance (d) from the central axis. During the travel, the probe tips move outwards by the offset (v). The table below shows the radial offset in different travel lenghts (mm).
|Offset -v (mm)||0.06||0.12||0.18||0.24||0.30|